BiTS 2016

BiTS is the preeminent event for what’s Now & Next in the test of pack­aged integrated circuits (ICs). The technical pro­gram and exhibition is dedicated to providing a forum for the latest in­for­mation on a broad range of test topics in­clud­ing final, wafer sort, and burn-in. You will have many oppor­tu­ni­ties to meet, network, and explore ideas with other test professionals who are focused on test consumables, test cell integration, and test operations.


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